Scanning Electron Microscope FM-SEM-A100 is a sophisticated imaging instrument used for high-resolution visualization of surfaces at the nanoscale level. Equipped with Schottky Field Emission Electron Gun, with in cylinder Deceleration. It uses a focused beam of electrons to scan the specimen's surface. It has five axis automatic working stage.
Specifications:
Magnification
1x to 2,500,000x
Resolution
1.0 nm at 15 kV (SE), 1.5 nm at 1 kV (SE), 0.8 nm at 30 kV (STEM)
Voltage
20 V to 30 kV
Electron Gun
Schottky Field Emission Electron Gun, In- cylinder Deceleration, Electromagnetic Composite Objective, Water-cooled Thermostatic Objective
Vacuum System
Type
Fully Auto Control Oil Free Vacuum
Sample Room pressure
< 5×10-4 Pa
Electron Gun pressure
< 9 ×10-8 Pa
Vacuum Pump
Mechanical pump flow rate
> 6 m3/h
Turbo molecular pump flow rate
> 240 L/s
Ion pump flow rate
>25 L/s
Working Stage
5 Axes Auto Stage, X：120 mm, Y：115 mm, Z：50 mm, T: -10° to + 90°, R: 360°
Magnetic Field Lens (MFL) improves imaging capabilities
Optical navigation aids in the precise positioning and navigation of samples
Automated function for automated focusing, stage movement
Human-Computer Interaction efficiently controls and monitor the instrument
Applications:
Scanning Electron Microscope is widely used across various scientific and industrial fields, including materials science, biology, geology, and nanotechnology.
