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Scanning Electron Microscope FM-SEM-A100 Catalog

Overview

Scanning Electron Microscope FM-SEM-A100 is a sophisticated imaging instrument used for high-resolution visualization of surfaces at the nanoscale level. Equipped with Schottky Field Emission Electron Gun, with in cylinder Deceleration. It uses a focused beam of electrons to scan the specimen's surface. It has five axis automatic working stage.

Specifications:

Magnification 1x to 2,500,000x
Resolution 1.0 nm at 15 kV (SE), 1.5 nm at 1 kV (SE), 0.8 nm at 30 kV (STEM)
Voltage 20 V to 30 kV
Electron Gun Schottky Field Emission Electron Gun, In- cylinder Deceleration, Electromagnetic Composite Objective, Water-cooled Thermostatic Objective
Vacuum System Type - Fully Auto Control Oil Free VacuumSample Room pressure - < 5×10-4 PaElectron Gun pressure
Vacuum Pump Mechanical pump flow rate - > 6 m3/hTurbo molecular pump flow rate - > 240 L/sIon pump flow rate - >25 L/s
Working Stage 5 Axes Auto Stage, X:120 mm, Y:115 mm, Z:50 mm, T: -10° to + 90°, R: 360°
Camera Vertical Optical Navigation CCD, Horizontal Monitoring CCD
Detector Secondary Electron Detector (ETD), High Angle Electron Detector In lens
Software SEM Operation Software
Display Multi-Channel Display
Navigation Gesture navigation
Image enhancement features Auto Brightness Contrast, Auto Focus, Auto Astigmatism
Image format support TIFF, JPG, BMP, PNG
Computer specification Working Station, Memory: 16 G, Hard Disk: 512 G, 24-inch Monitor, Win10 operating system
Installation Room Dimension (L×W×H) - 3000×4000 ×2300 mmTemperature - 20 to 25 ℃Humidity - < 50%
Power Supply AC 220 V (±10 %), 50 Hz,2 kVA
packaging dimension (L×W×H) 180 × 160 × 200 cm
Net weight 400 kg
Gross weight 950 kg

Features:

  • Field emission scanning electron microscope with high resolution
  • Advanced Tube Design to enhance beam stability and focus
  • High-pressure tunnel technology examines samples sensitive to vacuum
  • Low aberration design minimizes optical distortion
  • Magnetic Field Lens (MFL) improves imaging capabilities
  • Optical navigation aids in the precise positioning and navigation of samples
  • Automated function for automated focusing, stage movement
  • Human-Computer Interaction efficiently controls and monitor the instrument

Applications:

Scanning Electron Microscope is widely used across various scientific and industrial fields, including materials science, biology, geology, and nanotechnology.

Accessories Optional:
Accessories noNameQuantity
1BSE Back Scattering1
2EDS Energy Dispersive1
3EBSD, Electron Beam Backscattered1
4EBSD Bruker Quantax e-Flash1
5EDS+EBSD, Electron1
6STEM1
7EBIC, Electron Beam1
9Knob Control Panel &Trackball1
10Sample Exchange1
11Beam Gate & Electron1
12Low Vacuum Detector (LV Module, Work With BSE)1
13Double Anode (Tetrode)1
14Tungsten Filament6 pcs in one box
15Large Size Image Stitching Software1
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