Scanning Electron Microscope FM-SEM-A100

Scanning Electron Microscope FM-SEM-A100

Scanning Electron Microscope FM-SEM-A100 is a sophisticated imaging instrument used for high-resolution visualization of surfaces at the nanoscale level. Equipped with Schottky Field Emission Electron Gun, with in cylinder Deceleration. It uses a focused beam of electrons to scan the specimen's surface. It has five axis automatic working stage.

  •  Field emission scanning electron microscope with high resolution
  •  Advanced Tube Design to enhance beam stability and focus
  •  High-pressure tunnel technology examines samples sensitive to vacuum
  •  Low aberration design minimizes optical distortion
  •  Magnetic Field Lens (MFL) improves imaging capabilities
  •  Optical navigation aids in the precise positioning and navigation of samples
  •  Automated function for automated focusing, stage movement
  •  Human-Computer Interaction efficiently controls and monitor the instrument

Magnification 1x to 2,500,000x
Resolution 1.0 nm at 15 kV (SE), 1.5 nm at 1 kV (SE), 0.8 nm at 30 kV (STEM)
Voltage 20 V to 30 kV
Electron Gun Schottky Field Emission Electron Gun, In- cylinder Deceleration, Electromagnetic Composite Objective, Water-cooled Thermostatic Objective
Vacuum System
TypeFully Auto Control Oil Free Vacuum
Sample Room pressure< 5×10-4 Pa
Electron Gun pressure< 9 ×10-8 Pa
Vacuum Pump
Mechanical pump flow rate> 6 m3/h
Turbo molecular pump flow rate> 240 L/s
Ion pump flow rate>25 L/s
Working Stage 5 Axes Auto Stage, X:120 mm, Y:115 mm, Z:50 mm, T: -10° to + 90°, R: 360°
Camera Vertical Optical Navigation CCD, Horizontal Monitoring CCD
Detector Secondary Electron Detector (ETD), High Angle Electron Detector In lens
Software SEM Operation Software
Display Multi-Channel Display
Navigation Gesture navigation
Image enhancement features Auto Brightness Contrast, Auto Focus, Auto Astigmatism
Image format support TIFF, JPG, BMP, PNG
Computer specification Working Station, Memory: 16 G, Hard Disk: 512 G, 24-inch Monitor, Win10 operating system
Installation Room
DimensionL > 3000 mm, W > 4000 mm, H > 2300 mm
Temperature20 to 25 ℃
Humidity< 50%
Power Supply AC 220 V (±10 %), 50 Hz,2 kVA

Scanning Electron Microscope is widely used across various scientific and industrial fields, including materials science, biology, geology, and nanotechnology.

Accessories no Name Quantity
1 BSE Back Scattering 1
2 EDS Energy Dispersive 1
3 EBSD, Electron Beam Backscattered 1
4 EBSD Bruker Quantax e-Flash 1
5 EDS+EBSD, Electron 1
6 STEM 1
7 EBIC, Electron Beam 1
9 Knob Control Panel &Trackball 1
10 Sample Exchange 1
11 Beam Gate & Electron 1
12 Low Vacuum Detector (LV Module, Work With BSE) 1
13 Double Anode (Tetrode) 1
14 Tungsten Filament 6 pcs in one box
15 Large Size Image Stitching Software 1