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Scanning Electron Microscope FM-SEM-A100 Scanning Electron Microscope FM-SEM-A100 Scanning Electron Microscope FM-SEM-A100 Scanning Electron Microscope FM-SEM-A100

Scanning Electron Microscope FM-SEM-A100

Scanning Electron Microscope FM-SEM-A100 is a sophisticated imaging instrument used for high-resolution visualization of surfaces at the nanoscale level. Equipped with Schottky Field Emission Electron Gun, with in cylinder Deceleration. It uses a focused beam of electrons to scan the specimen's surface. It has five axis automatic working stage.

$622,500.00

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Scanning Electron Microscope FM-SEM-A100 - Specifications

Magnification 1x to 2,500,000x
Resolution 1.0 nm at 15 kV (SE), 1.5 nm at 1 kV (SE), 0.8 nm at 30 kV (STEM)
Voltage 20 V to 30 kV
Electron Gun Schottky Field Emission Electron Gun, In- cylinder Deceleration, Electromagnetic Composite Objective, Water-cooled Thermostatic Objective
Vacuum System
TypeFully Auto Control Oil Free Vacuum
Sample Room pressure< 5×10-4 Pa
Electron Gun pressure< 9 ×10-8 Pa
Vacuum Pump
Mechanical pump flow rate> 6 m3/h
Turbo molecular pump flow rate> 240 L/s
Ion pump flow rate>25 L/s
Working Stage 5 Axes Auto Stage, X：120 mm, Y：115 mm, Z：50 mm, T: -10° to + 90°, R: 360°
Camera Vertical Optical Navigation CCD, Horizontal Monitoring CCD
Detector Secondary Electron Detector (ETD), High Angle Electron Detector In lens
Software SEM Operation Software
Display Multi-Channel Display
Navigation Gesture navigation
Image enhancement features Auto Brightness Contrast, Auto Focus, Auto Astigmatism
Image format support TIFF, JPG, BMP, PNG
Computer specification Working Station, Memory: 16 G, Hard Disk: 512 G, 24-inch Monitor, Win10 operating system
Installation Room
DimensionL > 3000 mm, W > 4000 mm, H > 2300 mm
Temperature20 to 25 ℃
Humidity< 50%
Power Supply AC 220 V (±10 %), 50 Hz，2 kVA

Scanning Electron Microscope FM-SEM-A100 - Features

  1. Field emission scanning electron microscope with high resolution
  2. Advanced Tube Design to enhance beam stability and focus
  3. High-pressure tunnel technology examines samples sensitive to vacuum
  4. Low aberration design minimizes optical distortion
  5. Magnetic Field Lens (MFL) improves imaging capabilities
  6. Optical navigation aids in the precise positioning and navigation of samples
  7. Automated function for automated focusing, stage movement
  8. Human-Computer Interaction efficiently controls and monitor the instrument

Scanning Electron Microscope FM-SEM-A100 - Applications

  • Scanning Electron Microscope is widely used across various scientific and industrial fields, including materials science, biology, geology, and nanotechnology.

Scanning Electron Microscope FM-SEM-A100 - Accessories Optional

  • Accessories noNameQuantity
    1BSE Back Scattering1
    2EDS Energy Dispersive1
    3EBSD, Electron Beam Backscattered1
    4EBSD Bruker Quantax e-Flash1
    5EDS+EBSD, Electron1
    6STEM1
    7EBIC, Electron Beam1
    9Knob Control Panel &Trackball1
    10Sample Exchange1
    11Beam Gate & Electron1
    12Low Vacuum Detector (LV Module, Work With BSE)1
    13Double Anode (Tetrode)1
    14Tungsten Filament6 pcs in one box
    15Large Size Image Stitching Software1
Scanning Electron Microscope FM-SEM-A100

Scanning Electron Microscope FM-SEM-A100

Scanning Electron Microscope

Fison Scanning Electron Microscopes are non-destructive and capture high-resolution images down to 0.8 nm. It offers up to 2.5-million-fold magnification via precision electromagnetic lenses. Equipped with auto-operated oil free vacuum system for contamination-free, maintenance-free working environment. It features multi-digital display with advanced camera and diverse application software. Our Scanning Electron Microscopes are experts in surface topography mapping of nanomaterials, biological samples and much more.