Scanning Electron Microscope FM-SEM-A100
Scanning Electron Microscope FM-SEM-A100 is a sophisticated imaging instrument used for high-resolution visualization of surfaces at the nanoscale level. Equipped with Schottky Field Emission Electron Gun, with in cylinder Deceleration. It uses a focused beam of electrons to scan the specimen's surface. It has five axis automatic working stage.
Specifications
| Magnification | 1x to 2,500,000x | ||||||
| Resolution | 1.0 nm at 15 kV (SE), 1.5 nm at 1 kV (SE), 0.8 nm at 30 kV (STEM) | ||||||
| Voltage | 20 V to 30 kV | ||||||
| Electron Gun | Schottky Field Emission Electron Gun, In- cylinder Deceleration, Electromagnetic Composite Objective, Water-cooled Thermostatic Objective | ||||||
| Vacuum System |
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| Vacuum Pump |
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| Working Stage | 5 Axes Auto Stage, X：120 mm, Y：115 mm, Z：50 mm, T: -10° to + 90°, R: 360° | ||||||
| Camera | Vertical Optical Navigation CCD, Horizontal Monitoring CCD | ||||||
| Detector | Secondary Electron Detector (ETD), High Angle Electron Detector In lens | ||||||
| Software | SEM Operation Software | ||||||
| Display | Multi-Channel Display | ||||||
| Navigation | Gesture navigation | ||||||
| Image enhancement features | Auto Brightness Contrast, Auto Focus, Auto Astigmatism | ||||||
| Image format support | TIFF, JPG, BMP, PNG | ||||||
| Computer specification | Working Station, Memory: 16 G, Hard Disk: 512 G, 24-inch Monitor, Win10 operating system | ||||||
| Installation Room |
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| Power Supply | AC 220 V (±10 %), 50 Hz，2 kVA |
Features
- Field emission scanning electron microscope with high resolution
- Advanced Tube Design to enhance beam stability and focus
- High-pressure tunnel technology examines samples sensitive to vacuum
- Low aberration design minimizes optical distortion
- Magnetic Field Lens (MFL) improves imaging capabilities
- Optical navigation aids in the precise positioning and navigation of samples
- Automated function for automated focusing, stage movement
- Human-Computer Interaction efficiently controls and monitor the instrument
Applications
- Scanning Electron Microscope is widely used across various scientific and industrial fields, including materials science, biology, geology, and nanotechnology.
Accessories Optional
Accessories no Name Quantity 1 BSE Back Scattering 1 2 EDS Energy Dispersive 1 3 EBSD, Electron Beam Backscattered 1 4 EBSD Bruker Quantax e-Flash 1 5 EDS+EBSD, Electron 1 6 STEM 1 7 EBIC, Electron Beam 1 9 Knob Control Panel &Trackball 1 10 Sample Exchange 1 11 Beam Gate & Electron 1 12 Low Vacuum Detector (LV Module, Work With BSE) 1 13 Double Anode (Tetrode) 1 14 Tungsten Filament 6 pcs in one box 15 Large Size Image Stitching Software 1
